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DC Field | Value | Language |
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dc.contributor.author | Ajenikoko, G. A.||||Raji, T. I. | - |
dc.contributor.author | Fakolujo, O. A. | - |
dc.contributor.author | Raji, T. I. | - |
dc.date.accessioned | 2018-10-12T10:07:53Z | - |
dc.date.available | 2018-10-12T10:07:53Z | - |
dc.date.issued | 2010 | - |
dc.identifier.issn | 1823-4690 | - |
dc.identifier.other | Journal of Engineering Science and Technology 5(2), pp. 51-55 | - |
dc.identifier.other | ui_art_ajenikoko_reliability_2010 | - |
dc.identifier.uri | http://ir.library.ui.edu.ng/handle/123456789/2199 | - |
dc.description.abstract | An electronic component is an entity in a system which can not be further sub divided in the course of a given relability. However a component can make up parts which is regarded as self-contained unit. Thus while thereliability of a system can be influenced by altering its structure, the reliability of what is considered a component cannot be changed in such a manner, and if different characteristics are desired, the component must be replaced by another with different reliability parameters. Electronic components can be classified into two groups. The first group are those that are observed only until they fail, because either they cannot repaired, or the repair is uneconomical, or the problem is such that only the life history up to the first failure is of interest. These called non-reparable (or non-repaired) and their failures are catastrophic. The second group are those components that are repaired upon failure, hence their life histories consist of alternating operating and repair periods. They are called repairable components. This paper presents the basic concept of electronic component reliability and quality assurance. A brief historical perspective is presented along with operational definitions. The factors affecting reliability as well as the costs to provide reliability re also described. Failure modes are depicted as well as the environmental effects that affects reliability. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | Duncan Science Company | en_US |
dc.subject | Reliability, | en_US |
dc.subject | quality assurance, | en_US |
dc.subject | failure rate, | en_US |
dc.subject | degree of failure, | en_US |
dc.subject | catastrophic failure, | en_US |
dc.subject | degradation failure | en_US |
dc.title | Reliability and quality assurance of electronic component | en_US |
dc.type | Article | en_US |
Appears in Collections: | scholarly works |
Files in This Item:
File | Description | Size | Format | |
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(24)ui_art_ajenikoko_reliability_2010.pdf | 2.68 MB | Adobe PDF | View/Open |
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